SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
Measurement of 3db Bandwidth of Laser Diode Chips
Xu Yao; Wang Wei; Wang Ziyu
2003
Source Publication半导体学报
Volume24Issue:8Pages:794-797
AbstractAn accurate technique for measuring the frequency response of semiconductor laser diode chips is proposed and experimentally demonstrated. The effects of test jig parasites can be completely removed in the measurement by a new calibration method. In theory, the measuring range of the measurement system is only determined by the measuring range of the instruments network analyzer and photo detector. Diodes' bandwidth of 7.5GHz and 10GHz is measured. The results reveal that the method is feasible and comparing with other method, it is more precise andeasier to use.
metadata_83institute of semiconductors, the chinese academy of sciences;department of electronic engineering, peking university
Subject Area半导体器件
Indexed ByCSCD
Language英语
CSCD IDCSCD:1208358
Date Available2010-11-23
Citation statistics
Cited Times:3[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/17817
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
Xu Yao,Wang Wei,Wang Ziyu. Measurement of 3db Bandwidth of Laser Diode Chips[J]. 半导体学报,2003,24(8):794-797.
APA Xu Yao,Wang Wei,&Wang Ziyu.(2003).Measurement of 3db Bandwidth of Laser Diode Chips.半导体学报,24(8),794-797.
MLA Xu Yao,et al."Measurement of 3db Bandwidth of Laser Diode Chips".半导体学报 24.8(2003):794-797.
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