SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
电吸收调制器和DFB激光器集成器件的测量
王幼林; 刘宇; 孙建伟; 祝宁华
2003
Source Publication半导体学报
Volume24Issue:9Pages:955-959
Abstract提出了一种测量电吸收调制器和激光器集成器件芯片散射参数的新方法。根据电吸收调制器和封装寄生参数的等效电路模型,对测量的反射系数进行拟合,得到封装寄生参数和电吸收调制器的等效电路元件的参数值。通过分析发现测试封装寄生参数对电吸收调制器的测试结果有很大影响。去除了封装寄生参数的影响后,得到了调制器的反射和传输参数的真实频响特性。
metadata_83中国科学院半导体研究所
Subject Area光电子学
Funding Organization国家“863”(Nos. 2 1AA312 3 ,2 1AA31219 ),“973”(No. G2 366 1),国家杰出青年基金(批准号
Indexed ByCSCD
Language中文
CSCD IDCSCD:1212865
Date Available2010-11-23
Citation statistics
Cited Times:4[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/17799
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
王幼林,刘宇,孙建伟,等. 电吸收调制器和DFB激光器集成器件的测量[J]. 半导体学报,2003,24(9):955-959.
APA 王幼林,刘宇,孙建伟,&祝宁华.(2003).电吸收调制器和DFB激光器集成器件的测量.半导体学报,24(9),955-959.
MLA 王幼林,et al."电吸收调制器和DFB激光器集成器件的测量".半导体学报 24.9(2003):955-959.
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