Effect of Annealing on Structural and Magnetic Properties of a Thick (Ga,Mn)As Layer

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	Effect of Annealing on Structural and Magnetic Properties of a Thick (Ga,Mn)As Layer
	Deng Jiajun; Zhao Jianhua; Jiang Chunping; Zhang Yan; Niu Zhichuan; Yang Fuhua; Wu Xiaoguang; Zheng Houzhi
	2005
Source Publication	Chinese Physics Letters
Volume	22 Issue:2 Pages:466-468
Abstract	We investigate effects of annealing on magnetic properties of a thick (Ga,Mn)As layer, and find a dramatic increase of the Curie temperature from 65 to 115 K by postgrowth annealing for a 500-nm (Ga,Mn)As layer. Auger electron spectroscopy measurements suggest that the increase of the Curie temperature is mainly due to diffusion of Mn interstitial to the free surface. The double-crystal x-ray diffraction patterns show that the lattice constant of (Ga,Mn)As decreases with increasing annealing temperature. As a result, the annealing induced reduction of the lattice constant is mainly attributed to removal of Mn interstitial.
metadata_83	institute of semiconductors, chinese academy of sciences, po box 912;school of physics, peking university
Subject Area	半导体物理
Funding Organization	Supported by the National Natural Science Foundaiton of China,Special Funds for Major State Basic Research Project of China
Indexed By	CSCD
Language	英语
CSCD ID	CSCD:1952284
Date Available	2010-11-23
Citation statistics
Document Type	期刊论文
Identifier	http://ir.semi.ac.cn/handle/172111/17125
Collection	中国科学院半导体研究所（2009年前）
Recommended Citation GB/T 7714	Deng Jiajun,Zhao Jianhua,Jiang Chunping,et al. Effect of Annealing on Structural and Magnetic Properties of a Thick (Ga,Mn)As Layer[J]. Chinese Physics Letters,2005,22(2):466-468.
APA	Deng Jiajun.,Zhao Jianhua.,Jiang Chunping.,Zhang Yan.,Niu Zhichuan.,...&Zheng Houzhi.(2005).Effect of Annealing on Structural and Magnetic Properties of a Thick (Ga,Mn)As Layer.Chinese Physics Letters,22(2),466-468.
MLA	Deng Jiajun,et al."Effect of Annealing on Structural and Magnetic Properties of a Thick (Ga,Mn)As Layer".Chinese Physics Letters 22.2(2005):466-468.

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