SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
A New Method to Investigate InGaAsP Single-Photon Avalanche Diodes Using a Digital Sampling Oscilloscope
Liu Wei; Yang Fuhua; Wu Meng
2006
Source Publication半导体学报
Volume27Issue:10Pages:1711-1716
AbstractA near-infrared single-photon detection system is established by using pigtailed InGaAs/InP avalanche photodiodes. With a 50GHz digital sampling oscilloscope, the function and process of gated-mode (Geiger-mode) single-photon detection are intuitionally demonstrated for the first time. The performance of the detector as a gated-mode single-photon counter at wavelengths of 1310 and 1550nm is investigated. At the operation temperature of 203K,a quantum efficiency of 52% with a dark count probability per gate of 2. 4 * 10~(-3), and a gate pulse repetition rate of 50kHz are obtained at 1550nm. The corresponding parameters are 43% , 8. 5 * 10~(-3), and 200kHz at 238K.
metadata_83institute of semiconductors, chinese academy of sciences
Subject Area微电子学
Funding Organization国家重点基础研究专项基金,中国科学院研究计划资助项目
Indexed ByCSCD
Language英语
CSCD IDCSCD:2429667
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/16609
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
Liu Wei,Yang Fuhua,Wu Meng. A New Method to Investigate InGaAsP Single-Photon Avalanche Diodes Using a Digital Sampling Oscilloscope[J]. 半导体学报,2006,27(10):1711-1716.
APA Liu Wei,Yang Fuhua,&Wu Meng.(2006).A New Method to Investigate InGaAsP Single-Photon Avalanche Diodes Using a Digital Sampling Oscilloscope.半导体学报,27(10),1711-1716.
MLA Liu Wei,et al."A New Method to Investigate InGaAsP Single-Photon Avalanche Diodes Using a Digital Sampling Oscilloscope".半导体学报 27.10(2006):1711-1716.
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