Knowledge Management System Of Institute of Semiconductors,CAS
| A Radial Stub Test Circuit for Microwave Power Devices | |
| Luo Weijun; Chen Xiaojuan; Liang Xiaoxin; Ma Xiaolin; Liu Xinyu; Wang Xiaoliang | |
| 2006 | |
| Source Publication | 半导体学报
 |
| Volume | 27Issue:9Pages:1557-1561 |
| Abstract | With the principles of microwave circuits and semiconductor device physics, two microwave power device test circuits combined with a test fixture are designed and simulated, whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8GHz. The simulation and experimental results verify that the test circuit with a radial stub is better than that without. As an example, a C-band AlGaN/GaN HEMT microwave power device is tested with the designed circuit and fixture. With a 5.4GHz microwave input signal, the maximum gain is 8.75dB, and the maximum output power is 33.2dBm. |
| metadata_83 | institute of semiconductors, chinese academy of sciences;institute of microelectronics, chinese academy of sciences |
| Subject Area | 半导体材料 |
| Funding Organization | 国家重点基础研究发展计划,中国科学院重点计划资助项目 |
| Indexed By | CSCD |
| Language | 英语 |
| CSCD ID | CSCD:2433817 |
| Date Available | 2010-11-23 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/16599 |
| Collection | 中国科学院半导体研究所（2009年前） |
| Recommended Citation GB/T 7714 | Luo Weijun,Chen Xiaojuan,Liang Xiaoxin,et al. A Radial Stub Test Circuit for Microwave Power Devices[J]. 半导体学报,2006,27(9):1557-1561. |
| APA | Luo Weijun,Chen Xiaojuan,Liang Xiaoxin,Ma Xiaolin,Liu Xinyu,&Wang Xiaoliang.(2006).A Radial Stub Test Circuit for Microwave Power Devices.半导体学报,27(9),1557-1561. |
| MLA | Luo Weijun,et al."A Radial Stub Test Circuit for Microwave Power Devices".半导体学报 27.9(2006):1557-1561. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 4253.pdf（694KB） | 限制开放 | -- | Application Full Text | |||
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