SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer
Tu Xiaoguang; Zhao Lei; Chen Ping; Chen Shaowu; Zuo Yuhua; Yu Jinzhong; Wang Qiming
2007
Source Publication半导体学报
Volume28Issue:7Pages:1012-1016
AbstractA polarization-maintaining (PM) fiber Mach-Zehnder (MZ) interferometer has been established to measure the EO effect of very thin film materials with optical anisotropy. Unlike a common MZ interferometer,all the components are connected via polarization-maintaining fibers. At the same time, a polarized DFB laser with a maximum power output of 10mW is adopted as the light source to induce a large extinction ratio. Here, we take it to determine the electro-optical coefficients of a very thin superlattice structure with GaAs, KTP, and GaN as comparative samples. The measured EO coefficients show good comparability with the others.
metadata_83institute of semiconductors,chinese academy of sciences
Subject Area光电子学
Funding Organization国家重点基础研究发展计划,国家自然科学基金资助项目
Indexed ByCSCD
Language英语
CSCD IDCSCD:2835997
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/16309
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
Tu Xiaoguang,Zhao Lei,Chen Ping,et al. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. 半导体学报,2007,28(7):1012-1016.
APA Tu Xiaoguang.,Zhao Lei.,Chen Ping.,Chen Shaowu.,Zuo Yuhua.,...&Wang Qiming.(2007).Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer.半导体学报,28(7),1012-1016.
MLA Tu Xiaoguang,et al."Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer".半导体学报 28.7(2007):1012-1016.
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