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题名: Electron diffraction and photoemission studies of clean and water-covered Si(5,5,12) and Si(112) surfaces
作者: Ranke W;  Xing YR
发表日期: 1997
摘要: The structure of silicon surfaces in the orientation range (113)-(5,5,12)-(337)-(112) has been investigated using high resolution LEED and photoemission both on a spherical and on flat samples. We find that Si(5,5,12) [5.3 degrees from (113) and 0.7 degrees from (937)] is the only stable orientation between (113) and (111) and confirm the result of Baski et al. [Science 269, 1556 (1995)] that it has a 2 x 1 superstructure with a very large unit cell of 7.68 x 53.5 Angstrom(2). Adsorption measurements of water on Si(5,5,12) yield a mobile precursor kinetics with two kinds of regions saturating at 0.25 and 0.15 ML which are related to adsorption on different sites. Using these results, a modified structure model is proposed. Surfaces between (113) and (5,5,12) separate into facets of these two orientations; between (5,5,12) and (112), they separate into (5,5,12) and (111) facets. (337) facets in this range may be considered as defective (5,5,12) facets.
KOS主题词: Scanning tunneling microscopy;  Atomic structure;  Adsorption;  Silicon;  Low energy electron diffraction;  Metric system;  Silicon;  Example;  Modeling
刊名: SURFACE REVIEW AND LETTERS
专题: 中国科学院半导体研究所(2009年前)_期刊论文

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Ranke W; Xing YR .Electron diffraction and photoemission studies of clean and water-covered Si(5,5,12) and Si(112) surfaces ,SURFACE REVIEW AND LETTERS,1997,4(1):15-23
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