Electronic characteristics of InAs self-assembled quantum dots
Wang HL; Feng SL; Zhu HJ; Ning D; Chen F; Wang HL Qufu Normal Univ Dept Phys Qufu 273165 Peoples R China.
2000
会议名称9th International Conference on Modulated Semiconductor Structures (MSS9)
会议录名称PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 7 (3-4)
页码383-387
会议日期JUL 12-16, 1999
会议地点FUKUOKA, JAPAN
出版地PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
出版者ELSEVIER SCIENCE BV
ISSN1386-9477
部门归属chinese acad sci, inst semicond, natl lab superlattices & microstruct, beijing 100083, peoples r china
摘要Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures containing self-assembled InAs quantum dots formed in GaAs matrices. The use of n- and p-type GaAs matrices allows us to study separately electron and hole levels in the quantum dots by the deep-level transient spectroscopy technique. From analysis of deep-level transient spectroscopy measurements it follows that the quantum dots have electron levels 130 meV below the bottom of the GaAs conduction band and heavy-hole levels at 90 meV above the top of the GaAs valence band. Combining with the photoluminescence results, the band structures of InAs and GaAs have been determined. (C) 2000 Elsevier Science B.V. All rights reserved.
关键词Inas/gaas Quantum Dots Self-assembled Structure Dlts Pl Band Offset Energy-levels Carrier Relaxation Spectroscopy
学科领域半导体物理
主办者Japan Soc Appl Phys.
收录类别CPCI-S
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/14985
专题中国科学院半导体研究所(2009年前)
通讯作者Wang HL Qufu Normal Univ Dept Phys Qufu 273165 Peoples R China.
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Wang HL,Feng SL,Zhu HJ,et al. Electronic characteristics of InAs self-assembled quantum dots[C]. PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS:ELSEVIER SCIENCE BV,2000:383-387.
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