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题名: Fourier transformation study of the Franz-Keldysh Oscillation in SIN+ GaAs structures
作者: Jin P;  Pan SH;  Liang JB
发表日期: 2000
摘要: Fourier transformation (FT) method has been used in the theoretical lineshape analysis of the Franz-Keldysh Oscillation (FKO) in detail by numerical simulation. The FKO of a set of GaAs SIN+ samples was obtained in photoreflectance measurements. The FT spectra of a part of the samples,including of the real part,imaginary part, and mode of the FT,are well consistent with the theoretical lineshapes. The ratio of the square root of the reduced mass of the light hole (LH) to the heavy hole (HH), root mu(1)/root mu(h), obtained in the analysis was in the range of 0.805 to 0.816 for different samples. In addition,the built-in electric field F-1, and the modulation field delta F = F-1 - F-2 induced by photo-modulation were also obtained in the analysis. However,for a few samples great difference was found in the lineshape of the real part and imaginary part of their FT spectra from the theoretical lineshape. In this case the mode of the FT spectra still can be used to obtain useful information.
KOS主题词: Fourier transformation;  Gallium arsenide;  attenuated total reflection;  Field;  electroabsorption;  Electron paramagnetic resonance spectroscopy;  alpha-particle spectra;  Optical spectrometers;  Spectrum analysis
刊名: ACTA PHYSICA SINICA
专题: 中国科学院半导体研究所(2009年前)_期刊论文

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推荐引用方式:
Jin P; Pan SH; Liang JB .Fourier transformation study of the Franz-Keldysh Oscillation in SIN+ GaAs structures ,ACTA PHYSICA SINICA,2000,49(9):1821-1828
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