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题名: Scattering-parameter measurements of laser diodes
作者: Zhu NH;  Liu Y;  Pun EYB;  Chung PS
发表日期: 2002
摘要: An accurate and simple technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips is proposed and demonstrated. All the packaging parasitics could be obtained accurately using a calibrated probe, and the impedance of the intrinsic diode chip is deduced from the directly measured reflection coefficient. The directly measured impedance of a laser diode is affected strongly by the short bond wire. In the frequency response (S(2)1) measurements of semiconductor laser diode chips, the test fixture consists of a microwave probe, a submount, and a bond wire. The S-parameters of the probe could be determined using the short-open-match (SOM) method. Both the attenuation and the reflection of the test fixture have a strong influence on the directly measured frequency response, and in our proposed technique, the effect of test fixture is completely removed.
KOS主题词: Calibration
刊名: OPTICAL AND QUANTUM ELECTRONICS
专题: 中国科学院半导体研究所(2009年前)_期刊论文

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Zhu NH; Liu Y; Pun EYB; Chung PS .Scattering-parameter measurements of laser diodes ,OPTICAL AND QUANTUM ELECTRONICS,2002,34 (8):747-757
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