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题名: Abatement of waste gases and water during the processes of semiconductor fabrication
作者: Wen RM;  Liang JW
发表日期: 2002
摘要: The purpose of this article is to examine the methods and equipment for abating waste gases and water produced during the manufacture of semiconductor materials and devices. Three separating methods and equipment are used to control three different groups of electronic wastes. The first group includes arsine and phosphine emitted during the processes of semiconductor materials manufacture. The abatement procedure for this group of pollutants consists of adding iodates, cupric and manganese salts to a multiple shower tower (MST) structure. The second group includes pollutants containing arsenic, phosphorus, HF, HCl, NO2, and SO3 emitted during the manufacture of semiconductor materials and devices. The abatement procedure involves mixing oxidants and bases in an oval column with a separator in the middle. The third group consists of the ions of As, P and heavy metals contained in the waste water. The abatement procedure includes adding CaCO3 and ferric salts in a flocculation-sedimentation compact device equipment. Test results showed that all waste gases and water after the abatement procedures presented in this article passed the discharge standards set by the State Environmental Protection Administration of China.
KOS主题词: Waste gases;  effluents;  wastewater;  pollutant;  semiconductor;  Trace
刊名: JOURNAL OF ENVIRONMENTAL SCIENCES-CHINA
专题: 中国科学院半导体研究所(2009年前)_期刊论文

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Wen RM; Liang JW .Abatement of waste gases and water during the processes of semiconductor fabrication ,JOURNAL OF ENVIRONMENTAL SCIENCES-CHINA,2002 ,14 (4):482-488
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