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题名: Frequency limitation in the calibration of microwave test fixtures
作者: Zhu NH;  Qian C;  Wang YL;  Pun EYB;  Chung PS
发表日期: 2003
摘要: The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.
KOS主题词: Calibration
刊名: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
专题: 中国科学院半导体研究所(2009年前)_期刊论文

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推荐引用方式:
Zhu NH; Qian C; Wang YL; Pun EYB; Chung PS .Frequency limitation in the calibration of microwave test fixtures ,IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,2003,51 (9):2000-2006
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