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题名: A complex Fourier transformation study of the contactless electroreflectance of an undoped-n(+) GaAs structure
作者: Jin P;  Pan SH;  Li YG;  Zhang CZ;  Wang ZG
发表日期: 2006
摘要: Complex Fourier transformation (CFT) has been employed to analyse contactless electroreflectance (CER) spectra from an undoped-n(+) GaAs structure with various ac modulations and dc bias voltages. The CFT spectra of CER have been compared with those of photoreflectance (PR). It has been found that the CER non-flat modulation is between the built-in electric field and a larger electric field which increases with the modulation voltage. The result has been explained by the screening of the applied modulation electric field in one of the two half modulation cycles and the trapping of electrons in surface states in the other half modulation cycle. The dc bias does not change the CER spectra, hence their CFT spectra. This is because of the screening of the applied dc bias electric field.
KOS主题词: Fermi level;  Fermi surface;  attenuated total reflection;  Surface;  Electron paramagnetic resonance spectroscopy;  alpha-particle spectra;  Optical spectrometers;  Spectrum analysis
刊名: SEMICONDUCTOR SCIENCE AND TECHNOLOGY
专题: 中国科学院半导体研究所(2009年前)_期刊论文

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推荐引用方式:
Jin P; Pan SH; Li YG; Zhang CZ; Wang ZG .A complex Fourier transformation study of the contactless electroreflectance of an undoped-n(+) GaAs structure ,SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2006,21(6):786-789
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